Areas of Interest
Recent efforts in this optics laboratory include the developement of a combined spatial and temporal resolved optical microscope. Far sub-wavelength resolution is provided by geometrically confining light in a near-field optical microscope (NSOM). Temporal resolution is obtained with fast electronics or pulsed light. Results to date include images of carrier processes in silicon. Other efforts focus on sub-wavelength resolution Raman spectroscopy, which will become important in our studies of particulate matter from the air -- of current environmental concern. Dr. Hallen is also a member of the Precision Engineering Center.
Recent Publications
"Hot electron interactions at the passivated gold-silicon interface,"
Phys. Rev. Lett.
69.
H.D. Hallen, A. Fernandez, T. Huang, R.A. Buhrman, and J. Silcox.
(1992). p. 2931.
"Ballistic electron emission microscopy: from electron transport studies to nanoscale materials science,"
The Technology of Proximal Probe Lithography.
I.
H.D. Hallen.
SPIE, Bellingham, edited by Christie Marrian.
(1993). p. S10.
"Direct spatial imaging of vortices in a superconducting wire network,"
Phys. Rev. Lett.
71.
H.D. Hallen, R. Seshadri, A.M. Chang, R. Miller, L.N. Pfeiffer, K. West, C.A. Murray, and H. F. Hess.
(1993). p. 3007.
"Time-resolved contrast in near-field scanning optical microscopy of semiconductors,"
SPIE Proceedings
2384.
A. LaRosa, C.L. Jahncke, and H.D. Hallen.
(1995). p. 101-108.
"Raman imaging with near-field scanning optical microscopy,"
Appl. Phys. Lett.
67.
C.L. Jahncke, M. A. Paesler, and H.D. Hallen.
(1995).
"Electromigration in YBCO using a Metal clad Near-Field Scanning Optical Microscope Probe,"
Appl. Phys. Lett.
77 (14).
S. H. Huerth, M. P. Taylor, H. D. Hallen, B. H. Moeckly.
(2000). p. 2127-2129.
"Electric field gradient effects in Raman spectroscopy,"
Phys. Rev. Lett.
85 (19).
Eric Ayars, H. D. Hallen and C. L. Jahncke.
(2000).
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